Spectrometry system with decreased light path

ABSTRACT

A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.

CROSS-REFERENCE

The present application is a continuation of U.S. patent applicationSer. No. 15/052,286, filed on Feb. 24, 2016, entitled “SpectrometrySystem with Decreased Light Path”, which is a continuation of U.S.patent application Ser. No. 14/702,342, filed on May 1, 2015, now U.S.Pat. No. 9,291,504, entitled “Spectrometry System with Decreased LightPath”, which is a continuation of PCT Application PCT/IL2014/050688,filed on Jul. 30, 2014, entitled “Spectrometry System and Method,Spectroscopic Devices and Systems”, which claims priority to U.S.Provisional Application Ser. No. 61/861,893, filed on Aug. 2, 2013,entitled “Spectrometer System”, U.S. Provisional Application Ser. No.61/923,422, filed on Jan. 3, 2014, entitled “Spectroscopic Devices andSystems”, and U.S. Provisional Application Ser. No. 61/985,447 filed onApr. 28, 2014, entitled “Spectroscopic Devices and Systems”, each ofwhich is incorporated herein by reference in its entirety.

INCORPORATION BY REFERENCE

All publications, patents, and patent applications mentioned in thisspecification are herein incorporated by reference to the same extent asif each individual publication, patent, or patent application wasspecifically and individually indicated to be incorporated by reference.

FIELD OF THE INVENTION

This invention relates to small, low-cost spectrometry systems. Forexample, it relates to hand-held systems that have sufficientsensitivity and resolution to perform spectroscopic analysis ofsubstances (including complex mixtures, e.g. foodstuffs).

BACKGROUND OF THE INVENTION

Spectrometers are used for many purposes. For example spectrometers areused in the detection of detects in industrial processes, satelliteimaging, and laboratory research. However these instruments havetypically been too large and too costly for the consumer market.

Spectrometers detect radiation from a sample and process the resultingsignal to obtain and present information about the sample that includesspectral, physical and chemical information about the sample. Theseinstruments generally include some type of spectrally selective elementto separate wavelengths of radiation received from the sample, and afirst-stage optic, such as a lens, to focus or concentrate the radiationonto an imaging array.

The prior spectrometers can be less than ideal in at least somerespects. Prior spectrometers having high resolution can be larger thanideal for use in many portable applications. Also, the cost of priorspectrometers can be greater than would be ideal. The priorspectrometers can be somewhat bulky, difficult to transport and theoptics can require more alignment than would be ideal in at least someinstances.

Although prior spectrometers with decreased size have been proposed. Theprior spectrometers having decreased size and optical path length canhave less than ideal resolution, sensitivity and less accuracy thanwould be ideal.

In light of the above, it an improved spectrometer that overcomes atleast some of the above mentioned deficiencies of the priorspectrometers would be beneficial. Ideally such a spectrometer would bea compact, integrated with a consumer device such as a cellulartelephone, sufficiently rugged and low in cost to be practical forend-user spectroscopic measurements of items, convenient and convenientto use.

SUMMARY OF THE INVENTION

Embodiments of the present disclosure provide an improved spectrometer,such as a low-cost, rugged spectrometer suitable for combination withconsumer devices and cloud computing. In many embodiments, thespectrometer comprises a plurality of isolated optical channelscomprising a plurality of isolated optical paths. The isolated opticalpaths have the advantage of decreasing cross-talk among the opticalpaths and allowing the spectrometer to have a decreased length withincreased resolution. In many embodiments, the isolated optical pathscomprise isolated parallel optical paths that allow the length of thedevice to be decreased substantially. In many embodiments, each isolatedoptical path extends from a filter of a filter array, through a lens ofa lens array, through a channel of a support array, to a region of asensor array. Each region of the sensor array comprises a plurality ofsensor elements in which a location of the sensor element corresponds tothe wavelength of light received based on an angle of light received atthe location, the focal length of the lens and the central wavelength ofthe filter. In many embodiments, a diffuser is located along the opticalpath prior to the filter array in order to provide at least constantangular distribution of light energy among the filters of the array. Inmany embodiments, a second diffuser is located along the optical pathbetween the diffuser and the filter at a sufficient distance from thediffuser in order to receive a substantially uniform distribution oflight energy across the second diffuser in order to further homogenizethe light and provide a constant angular distribution of the lightenergy transmitted to the filter array.

In many embodiments, the spectrometer system provides a substantiallystraight optical axis and a short light path. The straight optical axisand short light path enable production of spectrometers that are smallenough and economical enough to fit in devices such as cellular phones,and yet have sufficient sensitivity and resolution (e.g. <10 nm) toobtain useful spectra of complex mixtures.

In many embodiments a compact spectrometer system for obtaining thespectrum of a sample comprises (a) an optical detector for detectinglight emanating from said sample; (b) an optical filter located betweensaid sample and said detector; and (c) a first Fourier transformfocusing element, wherein said compact spectrometer system does notcontain any dispersive optical elements.

In one aspect, provided herein is a spectrometer, the spectrometercomprising: a plurality of isolated optical paths extending from afilter array to a sensor array. In many embodiments, the spectrometerfurther comprises: a plurality of regions of the sensor array; aplurality of filters of the filter array; a plurality of lenses of alens array; and a support array extending between the plurality ofregions of the sensor array and the plurality of lenses of the lensarray, the support array comprising a plurality of light transmittingchannels defined with a non-optically transmissive material, wherein theplurality of isolated optical paths extends from the plurality of lensesthrough the plurality of channels to the plurality of regions in orderto isolate the plurality of channels.

In another aspect, provided herein is a spectrometer comprising: adiffuser; a detector comprising a plurality of regions, each region ofsaid plurality of regions comprising multiple sensors; a lens arraycomprising a plurality of lenses, each lens of the lens arraycorresponding to a region of said plurality of regions; and a filterarray corresponding to the lens array, the filter array comprising aplurality of filters, wherein each filter of the plurality of filters isconfigured to transmit a range of wavelengths different from otherfilters of the plurality.

In many embodiments, the range of wavelengths overlaps with ranges ofsaid other filters of the plurality and wherein said each filtercomprises a central wavelength different from said other filters of theplurality.

In many embodiments, the plurality of filters comprises a plurality ofinterference filters, the plurality of interference filters arrangedwith the plurality of lenses to vary an optical path length through eachof the interference filters in order to determine spectra of each of theplurality of regions.

The filter array can comprise a substrate having a thickness and a firstside and a second side, the first side oriented toward the diffuser, thesecond side oriented toward the lens array and detector, wherein thefilter array comprises a plurality of coatings on the second sideoriented toward the lens array to inhibit cross-talk among lenses of thearray.

In many embodiments, the plurality of coatings on the second sidecomprises a plurality of interference filters, said each of theplurality of interference filters on the second side configured totransmit a central wavelength of light to one lens of the plurality oflenses.

The filter array can comprise one or more coatings on the first side ofthe filter array, for example, the first side of the array comprises acoating to balance mechanical stress. Alternatively or in combination,the one or more coatings on the first side of the filter array comprisesan optical filter. For example, the optical filter on the first side ofthe filter array comprises an IR pass filter to selectively passinfrared light.

In many embodiments, the first side of the substrate does not comprise acoating.

The spectrometer can further comprise a support extending between thedetector and the lens array, the support shaped and sized in order tosupport the lens array and position the lens array at a focal lengthfrom the detector, the support comprising a plurality of channels topass light from the plurality of lenses of the array to the plurality ofregions of the detector.

In many embodiments, the support comprises a light absorbing materiallocated on a wall of said each of the plurality of channels in order toinhibit cross-talk among the plurality of channels.

The support can comprise an axis extending a distance from an uppersurface of the detector to a lower surface of the lens array and whereinthe support comprises stiffness in order to fix the distance from theupper surface to the lower surface at the focal length.

The image sensor can comprise a bare die surface in contact with thesupport to position each of the plurality of lenses at the focal lengthfrom the bare die surface.

The plurality of regions can comprise a plurality of active regions andwherein the plurality of channels corresponds to the plurality of activeregions and wherein the support comprises end structures sized andshaped to contact the bare die surface at a plurality of contactlocations away from the plurality of active regions.

The spectrometer described herein can comprise an aperture arraycomprising a plurality of apertures formed in a non-opticallytransmissive material, the plurality of apertures dimensioned to definea clear lens aperture of each lens of the array, wherein the clear lensaperture of each lens is limited to one filter of the array.

For example, the clear lens aperture of each lens can be limited to onefilter of the array.

In many embodiments, the spectrometer further comprises a filter supportto hold the filters plurality of filters in place between the diffuserand the plurality of lenses.

The spectrometer described herein can comprise an optically transmissiveplate placed over the plurality of filters to seal the plurality offilters.

In many embodiments, the diffuser is configured to receive incidentlight from a material of a sample to be analyzed and transmit diffuselight and wherein an angular profile of the transmitted diffuse light issubstantially fixed and substantially independent of an angle ofincidence of the light from the sample. The diffuser can comprise acosine diffuser to generate a Lambertian light distribution.

The spectrometer can comprise an IR pass filter composed of an IRtransmissive material, wherein the diffuser is formed in a surface ofthe IR transmissive material.

In many embodiments, the spectrometer further comprises a seconddiffuser formed in a second surface of the IR transmissive materialopposite the surface, wherein the second diffuser distributes incominglight across the diffuser.

The spectrometer can comprise a second IR pass filter and a housing, thehousing covering the diffuser, the filter array, and the lens array,wherein the housing is coupled to the second IR pass filter and asupport comprising a plurality of apertures and wherein the diffuser,the filter array, and the lens array are arranged sequentially betweenthe second IR pass filter and the support comprising the plurality ofapertures in order to couple the support, the filter array and the lensarray to a bare surface of the detector.

In many embodiments of the spectrometer described herein, thespectrometer further comprises a processor comprising a tangible mediumembodying instructions to determine spectra in response to signals fromthe detector.

The processor can comprise instructions to stitch together spectra fromeach of the regions in order to determine a spectrum of a target site ofa material.

The spectrometer can further comprise: an illuminator, the illuminatorcomprising, a) a primary radiation emitter to emit primary radiationwithin a first wavelength range and, b) a secondary radiation emitter toemit secondary radiation within a second wavelength range different fromthe first wavelength range.

The primary radiation emitter can comprise one or more of a lightemitting diode or a laser diode and wherein the secondary emittercomprises on or more of a phosphorescent plate, a phosphor plate,phosphor powder, nanocrystals, or nano-crystal powder.

The secondary radiation emitter can contact packaging of the primaryradiation emitter to inhibit heating of the secondary emitter andwherein the packaging comprises a heat sink to conduct heat away fromthe secondary radiation emitter.

In many embodiments, a gap extends between the secondary radiationemitter and packaging of the primary radiation emitter to inhibitheating of the secondary emitter.

The spectrometer can comprise a temperature sensor having a field ofview oriented to overlap with a field of view of the detector and afield of view of an illuminator.

The illuminator can comprise optics arranged to direct light from thesecondary radiation emitter toward a field of view of the detector.

In another aspect, provided herein is a spectrometer assemblycomprising: a housing; an optically transmissive cover plate; adiffuser; a filter array comprising a plurality of filters; a lens arraycomprising plurality of lenses; and a support comprising a plurality ofchannels; wherein the housing covers the diffuser, the filter array andthe lens array with the transmissive cover plate on a first end of theassembly and the support on a second end of the assembly in order toplace the support on a detector to measure spectra.

In yet another aspect, provided herein is a spectrometer comprising alight path, the light path passing sequentially through a diffuser, afilter matrix, and a lens array; wherein the light path ends at adetector; wherein the detector comprises multiple sensors; wherein thelight path from the diffuser to the detector is less than 9 mm; andwherein the resolution of the spectrometer is less than 20 nm.

A spectrometer comprising a light path, the light path passingsequentially through a diffuser, a filter matrix, and a lens array;wherein the light path ends at a detector; wherein the detectorcomprises multiple sensors; wherein the light path from the diffuser tothe detector is less than 9 mm; and wherein the resolution of thespectrometer is less than 10 nm. The resolution can be less than 25, 24,23, 22, 21, 20, 19, 18, 17, 16, 15, 14, 13, 12, 10, 9 or 8 nm.

The light path beginning at the diffuser and ending at the detector canbe less than 6 mm or less than 4.5 mm.

The resolution of the spectrometer can be less than 8 nm. The resolutionof the spectrometer can be less than 5 nm.

The detectable wavelength range can be larger than 100 nm. Thedetectable wavelength range can be larger than 200 nm. The detectablewavelength range can be larger than 300 nm.

In many embodiments, the spectrometer does not comprise a dispersiveoptical element.

Also provided herein, is a spectrometer comprising a detector forreceiving light wherein the light received by the detector is anoncontiguous spectrum.

The spectrometer can comprise a filter matrix, the filter matrixcomprising multiple sub-filters.

In many embodiments, one point on the detector receives light frommultiple sub-filters.

The spectrometer provided herein can further comprise a pre-filterbefore the filter matrix in the light path.

The pre-filter can be chosen from a group consisting of: (a) absorbingglass and (b) interference filter.

In many embodiments, the diffuser can be a cosine diffuser.

A secondary diffuser can be added between the diffuser and the filtermatrix.

The distance between the diffuser and the secondary diffuser can be atleast 0.5 mm.

In many embodiments, the transmission spectra of the filters in thefilter matrix vary with angle of incidence.

The filter matrix can be composed of interference filters.

The interference filters can be deposited on a substrate thinner than 2mm.

In many embodiments, the interference filters are deposited only on asingle side of a substrate.

The deposited side of the interference filters can be facing towards thelens array.

The filters in the filter matrix can be arranged in a specific order tominimize cross talk on the detector of light emerging from differentfilters.

In many embodiments, the spectrometer can comprise at least one opaqueaperture array between the filter matrix and the lens array.

The spectrometer can comprise an opaque absorbing aperture array betweenthe filter matrix and the detector.

The optical surfaces of the lenses in the lens array can be a-spherical.

Individual lens of the lens array can have two optical surfaces whereboth optical surfaces can be substantially convex.

The spectra of each filter in the matrix can overlap another filter inthe matrix.

In many embodiments of the matrix, the overlap can allow stitching ofspectra generated by two different filters.

The spectrometer can further comprise an illumination system.

The illumination system can comprise LEDs.

The LEDs can be divided into at least two groups, each operated atdifferent times.

The spectrometer can comprise at least one power resistor for thermalcontrol.

The spectrometer can further comprise a phosphor plate in front of theLEDs.

The phosphor can be near infra-red phosphor.

The spectrometer can comprise a thermal sensor capable of measuring asampled material's temperature.

In many embodiments, the spectrometer further comprises a referenceelement in front of the spectrometer.

The reference element can be removable.

The reference element can be movable.

The detector can be a 2D CMOS sensor.

The multiple sensors can be pixels on a CCD.

The multiple sensors can each receive light from more than one narrowwavelength band.

In many embodiments of the spectrometer, the multiple sensors eachreceive light from more than one filter of the filter matrix.

In another aspect, further provided herein is a method of measuringspectrum, the method comprising: transmitting light along a plurality ofisolated optical paths extending from a filter array to a sensor arrayin order to measure the spectrum.

In many embodiments of the method, the spectrum comprises a plurality ofspectra.

Further provided herein is a method, the method comprising providing aspectrometer as described herein.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows schematic diagrams of the optical layout in accordance withembodiments.

FIG. 2 shows a schematic diagram of a spectrometer system, in accordancewith embodiments.

FIG. 3 shows a schematic diagram of a spectrometer head, in accordancewith embodiments.

FIG. 4 shows a schematic diagram of cross-section A of the spectrometerhead of FIG. 3, in accordance with embodiments.

FIG. 5 shows a schematic diagram of cross-section B of the spectrometerhead of FIG. 3, accordance with embodiments.

FIG. 6 shows a schematic diagram of a spectrometer module, in accordancewith embodiments.

FIG. 7 shows a schematic diagram of apertures formed in anon-transmissive material and a lens array, in accordance withembodiments.

FIG. 8 shows a schematic diagram of a spectrometer, in accordance withembodiments.

DETAILED DESCRIPTION OF THE INVENTION

In the following description, various aspects of the invention will bedescribed. For the purposes of explanation, specific details are setforth in order to provide a thorough understanding of the invention. Itwill be apparent to one skilled in the art that there are otherembodiments of the invention that differ in details without affectingthe essential nature thereof. Therefore the invention is not limited bythat which is illustrated in the figure and described in thespecification, but only as indicated in the accompanying claims, withthe proper scope determined only by the broadest interpretation of saidclaims.

A better understanding of the features and advantages of the presentdisclosure will be obtained by reference to the following detaileddescription that sets forth illustrative embodiments, in which theprinciples of embodiments of the present disclosure are utilized, andthe accompanying drawings.

The embodiments disclosed herein can be combined in one or more of manyways to provide improved spectrometer methods and apparatus.

As used herein like characters refer to like elements.

As used herein “light” encompasses electromagnetic radiation havingwavelengths in one or more of the ultraviolet, visible, or infraredportions of the electromagnetic spectrum.

As used herein, the term “dispersive” is used, with respect to opticalcomponents, to describe a component that is designed to separatespatially, the different wavelength components of a polychromatic beamof light. Non-limiting examples of “dispersive” optical elements by thisdefinition include diffraction gratings and prisms. The termspecifically excludes elements such as lenses that disperse lightbecause of non-idealities such as chromatic aberration or elements suchas interference filters that have different transmission profilesaccording to the angle of incident radiation. The term also excludes thefilters and filter matrixes described herein.

Reference is now made to FIG. 1, which illustrates non-limitingembodiments of the compact spectrometer system 100 herein disclosed. Asillustrated the system comprises a diffuser 164, a filter matrix 170, alens array 174 and a detector 190.

In many embodiments, the spectrometer system comprises a plurality ofoptical filters of filter matrix 170. The optical filter can be of anytype known in the art. Non-limiting examples of suitable optical filtersinclude Fabry-Perot (FP) resonators, cascaded FP resonators, andinterference filters. For example, a narrow bandpass filter (≤10 nm)with a wide blocking range outside of the transmission band (at least200 nm) can be used. The center wavelength (CWL) of the filter can varywith the incident angle of the light impinging upon it.

In many embodiments, the central wavelength of the central band can varyby 10 nm or more, such that the effective range of wavelengths passedwith the filter is greater than the bandwidth of the filter. In manyembodiments, the central wavelength varies by an amount greater than thebandwidth of the filter. For example, the bandpass filter can have abandwidth of no more than 10 nm and the wavelength of the central bandcan vary by more than 10 nm across the field of view of the sensor.

In many embodiments, the spectrometer system comprises detector 190,which may comprise an array of sensors. In many embodiments, thedetector is capable of detecting light in the wavelength range ofinterest. The compact spectrometer system disclosed herein can be usedfrom the UV to the IR, depending on the nature of the spectrum beingobtained and the particular spectral properties of the sample beingtested. In some embodiments, a detector that is capable of measuringintensity as a function of position (e.g. an array detector or atwo-dimensional image sensor) is used.

In some embodiments the spectrometer does not comprise a cylindricalbeam volume hologram (CVBH).

In many embodiments, the spectrometer system comprises a diffuser. Inembodiments in which the light emanating from the sample is notsufficiently diffuse, a diffuser can be placed in front of otherelements of the spectrometer. Collimated (or partially collimated light)can impinge on the diffuser, which then produces diffuse light whichthen impinges on other aspects of the spectrometer, e.g. an opticalfilter.

In many embodiments, the spectrometer system comprises a filter matrix.The filter matrix can comprise one or more filters, for example aplurality of filters. The filter matrix can comprise more than 2, 10,50, or 100 filters (also referred to as sub-filters). The use of asingle filter can limit the spectral range available to thespectrometer. For example, if the angle of incidence of light is largerthan 30°, the system may not produce a signal of sufficient intensitydue to lens aberrations and the decrease in the efficiency of thedetector at large angles. For an angular range of 30° and an opticalfilter CWL of ˜850 nm, the spectral range available to the spectrometercan be about 35 nm, for example. As this range can be insufficient forsome spectroscopy based applications, embodiments with larger spectralranges may comprise an optical filter matrix composed of a plurality ofsub-filters. Each sub-filter can have a different CWL and thus covers adifferent part of the optical spectrum. The sub-filters can beconfigured in one or more of many ways and be tiled in two dimensions,for example.

Depending on the number of sub-filters, the wavelength range accessibleto the spectrometer can reach hundreds of nanometers. In embodimentscomprising a plurality of sub-filters, the approximate Fouriertransforms formed at the image plane (i.e. one per sub-filter) overlap,and the signal obtained at any particular pixel of the detector canresult from a mixture of the different Fourier transforms.

In some embodiments the filter matrix are arranged in a specific orderto inhibit cross talk on the detector of light emerging from differentfilters and to minimize the effect of stray light. For example, if thematrix is composed of 3×4 filters then there are 2 filters located atthe interior of the matrix and 10 filters at the periphery of thematrix. The 2 filters at the interior can be selected to be those at theedges of the wavelength range. Without being bound by a particulartheory the selected inner filters may experience the most spatialcross-talk but be the least sensitive to cross-talk spectrally.

In many embodiments, the spectrometer system comprises detector 190. Thedetector can be sensitive to one or more of ultraviolet wavelengths oflight, visible wavelengths of light, or infrared wavelengths of light.

The detector can be located in a predetermined plane. The predeterminedplane can be the focal plane of the lens array. Light of differentwavelengths (X1, X2, X3, X4, etc.) can arrive at the detector as aseries of substantially concentric circles of different radiiproportional to the wavelength. The relationship between the wavelengthand the radius of the corresponding circle may not be linear.

The detector, in some embodiments, receives non-continuous spectra, forexample spectra that can be unlike a dispersive element would create.The non-continuous spectra can be missing parts of the spectrum. Thenon-continuous spectrum can have the wavelengths of the spectra at leastin part spatially out of order, for example. In some embodiments, firstshort wavelengths contact the detector near longer wavelengths, andsecond short wavelengths contact the detector at distances further awayfrom the first short wavelengths than the longer wavelengths.

The detector may comprise a plurality of detector elements, such aspixels for example. Each detector element may be configured so as toreceive signals of a broad spectral range. The spectral range receivedon the first and second pluralities of detector elements may extend atleast from about 10 nm to about 400 nm. In many embodiments, spectralrange received on the first and second pluralities of detector elementsmay extend at least from about 10 nm to about 700 nm. In manyembodiments, spectral range received on the first and second pluralitiesof detector elements may extend at least from about 10 nm to about 1600nm. In many embodiments, spectral range received on the first and secondpluralities of detector elements may extend at least from about 400 nmto about 1600 nm. In many embodiments, spectral range received on thefirst and second pluralities of detector elements may extend at leastfrom about 700 nm to about 1600 nm.

In many embodiments the lens array, the filter matrix, and the detectorare not centered on a common optical axis. In many embodiments the lensarray, the filter matrix, and the detector are aligned on a commonoptical axis.

In many embodiments, the principle of operation of compact spectrometercomprises one or more of the following attributes. Light impinges uponthe diffuser. The light next impinges upon the filter matrix at a widerange of propagation angles and the spectrum of light passing throughthe sub-filters is angularly encoded. The angularly encoded light thenpasses through the lens array (e.g. Fourier transform focusing elements)which performs (approximately) a spatial Fourier transform of theangle-encoded light, transforming it into a spatially-encoded spectrum.Finally the light reaches the detector. The location of the detectorelement relative to the optical axis of a lens of the array correspondsto the wavelength of light, and the wavelength of light at a pixellocation can be determined based on the location of the pixel relativeto the optical axis of the lens of the array. The intensity of lightrecorded by the detector element such as a pixel as a function ofposition (e.g. pixel number or coordinate reference location) on thesensor corresponds to the resolved wavelengths of the light for thatposition.

In some embodiments, an additional filter is placed in front of thecompact spectrometer system in order to block light outside of thespectral range of interest (i.e. to prevent unwanted light from reachingthe detector).

In embodiments in which the spectral range covered by the opticalfilters is insufficient, additional sub-filters with differing CWLs canbe used.

In some embodiments shutters allow for the inclusion or exclusion oflight from part of the system. For example shutters can be used toexclude particular sub-filters. Shutters may also be used to excludeindividual lens.

In some embodiments, the measurement of the sample is performed usingscattered ambient light.

In many embodiments, the spectrometer system comprises a light source.The light source can be of any type (e.g. laser or light-emitting diode)known in the art appropriate for the spectral measurements to be made.In some embodiments the light source emits from 350 nm to 1100 nm. Thewavelength(s) and intensity of the light source will depend on theparticular use to which the spectrometer will be put. In someembodiments the light source emits from 0.1 mW to 500 mW

Because of its small size and low complexity, the compact spectrometersystem herein disclosed can be integrated into a mobile communicationdevice such as a cellular telephone. It can either be enclosed withinthe device itself, or mounted on the device and connected to it by wiredor wireless means for providing power and a data link. By incorporatingthe spectrometer system into a mobile device, the spectra obtained canbe uploaded to a remote location, analysis can be performed there, andthe user notified of the results of the analysis. The spectrometersystem can also be equipped with a GPS device and/or altimeter so thatthe location of the sample being measured can be reported. Furthernon-limiting examples of such components include a camera for recordingthe visual impression of the sample and sensors for measuring suchenvironmental variables as temperature and humidity.

Because of its small size and low cost, the spectrometer system hereindisclosed can also be integrated into kitchen appliances such as ovens(e.g. microwave ovens), food processors, toilets refrigerators etc. Theuser can then make a determination of the safety of the ingredients inreal time during the course of food storage and preparation.

In many embodiments, the spectrometer also includes a power source (e.g.a battery or power supply). In some embodiments the spectrometer ispowered by a power supply from a consumer hand held device (e.g. a cellphone). In some embodiments the spectrometer has an independent powersupply. In some embodiments a power supply from the spectrometer cansupply power to a consumer hand held device.

In many embodiments, the spectrometer comprises a processing and controlunit. In some embodiments the spectrometer does not analyze the datacollected, and the spectrometer relays data to a remote processing andcontrol unit, such as a back end server. Alternatively or incombination, the spectrometer may partially analyze the data prior totransmission to the remote processing and control unit. The remoteprocessing and control unit can be coupled to the spectrometer with aconsumer hand held device (e.g. a cell phone). The remote processing andcontrol unit can be a cloud based system which can transmit analyzeddata or results to a user. In some embodiments a hand held device isconfigured to receive analyzed data and can be associated with thespectrometer. The association can be through a physical connection orwireless communication, for example.

The spectrometers as described herein can be adapted, with proper choiceof light source, detector, and associated optics, for a use with a widevariety of spectroscopic techniques. Non-limiting examples includeRaman, fluorescence, and IR or UV-VIS reflectance and absorbancespectroscopies. Because, as described above, compact spectrometer systemcan separate a Raman signal from a fluorescence signal, in someembodiments of the invention, the same spectrometer is used for bothspectroscopies.

In some embodiments the spectrometer system comes equipped with a memorywith a database of spectral data stored therein and a microprocessorwith analysis software programmed with instructions. In some embodimentsthe spectrometer system is in communication with a computer memoryhaving a database of spectral data stored therein and a microprocessorwith analysis software programmed in. The memory can be volatile ornon-volatile in order to store the user's own measurements in thememory. The database and/or all or part of the analysis software canstored remotely, and the spectrometer system can communicate with theremote memory via a network (e.g. a wireless network) by any appropriatemethod. Alternatively, the database of spectral data can be providedwith a computer located near the spectrometer, for example in the sameroom.

In some embodiments in which the database is located remotely, the database can be updated often at regular intervals, for examplecontinuously. In these embodiments, each measurement made by a user ofthe spectrometer increases the quality and reliability of futuremeasurements made by any user.

Once a spectrum is then obtained it can be analyzed. In some embodimentsthe analysis is not contemporaneous. In some embodiments the analysis isin real time. The spectrum can be analyzed using any appropriateanalysis method. Non-limiting examples of spectral analysis techniquesthat can be used include Principal Components Analysis, Partial LeastSquares analysis, and the use of a neural network algorithm to determinethe spectral components.

An analyzed spectrum can determine whether a complex mixture beinginvestigated contains a spectrum associated with components. Thecomponents can be, e.g., a substance, mixture of substances, ormicroorganisms.

The intensity of these components in the spectrum can be used todetermine whether a component is at a certain concentration, e.g.whether their concentration of an undesirable component is high enoughto be of concern. Non-limiting examples of such substances includetoxins, decomposition products, or harmful microorganisms. In someembodiments of the invention, if it is deemed likely that the sample isnot fit for consumption, the user is provided with a warning.

In some embodiments, the spectrometer is connected to a communicationnetwork that allows users to share the information obtained in aparticular measurement. An updatable database located in the “cloud”(i.e. the distributed network) constantly receives the results ofmeasurements made by individual users and updates itself in real time,thus enabling each successive measurement to be made with greateraccuracy and confidence as well as expanding the number of substancesfor which a spectral signature is available.

In various embodiments of the invention, the conversion of the rawintensity data to a spectrum may be performed either locally (with aprocessor and software supplied with the spectrometer system) orremotely. Heavier calculations for more complicated analyses for examplecan be performed remotely.

In embodiments that incorporate remote data analysis, the datatransferred to the remote system may include one or more of raw detectordata; pre-processed detector data or post-processed detector data inwhich the processing was performed locally; or the spectrum derived fromthe raw detector data.

In some embodiments the spectrometer does not comprise a monochromator.

In some embodiments of the invention, the following signal processingscheme is used. First, an image or a series of images is captured by theimage sensor in the spectrometer mentioned above. The images areanalyzed by a local processing unit. This stage of analysis may includeany or all of image averaging, compensation for aberrations of theoptical unit, reduction of detector noise by use of a noise reductionalgorithm, or conversion of the image into a raw spectrum. The rawspectrum is then transmitted to a remote processing unit; in preferredembodiments, the transmission is performed using wireless communication.

The raw spectrum can be analyzed remotely. Noise reduction can beperformed remotely.

In embodiments in which a Raman spectrum is obtained, the Raman signalcan be separated from any fluorescence signal. Both Raman andfluorescence spectra can be compared to existing calibration spectra.After a calibration is performed, the spectra can be analyzed using anyappropriate algorithm for spectral decomposition; non-limiting examplesof such algorithms include Principal Components Analysis, PartialLeast-Squares analysis, and spectral analysis using a neural networkalgorithm. This analysis provides the information needed to characterizethe sample that was tested using the spectrometer. The results of theanalysis are then presented to the user.

FIG. 2 shows a schematic diagram of a spectrometer system according toembodiments. In many embodiments, the spectrometer system 100 comprisesa spectrometer 102 and a consumer hand held device 110 in wirelesscommunication 116 with a cloud based storage system 118. Thespectrometer 102 can acquire the data as described herein. The hand heldspectrometer 102 may comprise a processor 106 and communicationcircuitry 104 coupled to spectrometer head 120 having spectrometercomponents as described herein. The spectrometer can transmit the datato the handheld device 110 with communication circuitry 104 with acommunication link, such as a wireless serial communication link, forexample Bluetooth™. The hand held device can receive the data from thespectrometer 102 and transmit the data to a back end server of the cloudbased storage system 118.

The hand held device 110 may comprise one or more components of a smartphone, such as a display 112, an interface 114, a processor, a computerreadable memory and communication circuitry. The device 110 may comprisea substantially stationary device when used, such as a wirelesscommunication gateway, for example.

The processor 106 may comprise a tangible medium embodying instructions,such as a computer readable memory embodying instructions of a computerprogram. Alternatively or in combination the processor may compriselogic such as gate array logic in order to perform one or more logicsteps.

FIG. 3 shows a schematic diagram of spectrometer head in accordance withembodiments. In many embodiments, the spectrometer 102 comprises aspectrometer head 120. The spectrometer head comprises one or more of aspectrometer module 160, a temperature sensor module 130, and anillumination module 140. Each module, when present, can be covered witha module window. For example, the spectrometer module 160 can comprise aspectrometer window 162, the temperature sensor module 130 can comprisea temperature sensor window 132, and the illumination module 140 cancomprise an illumination window 142.

In many embodiments, the illumination module and the spectrometer moduleare configured to have overlapping fields of view at the sample. Theoverlapping fields of view can be provided in one or more of many ways.For example, the optical axes of the illumination source, thetemperature sensor and the matrix array can extend in a substantiallyparallel configuration. Alternatively, one or more of the optical axescan be oriented toward another optical axis of another module.

FIG. 4 shows a schematic drawing of cross-section A of the spectrometerhead of FIG. 3, in accordance with embodiments. In order to lessen thenoise and/or spectral shift produced from fluctuations in temperature, aspectrometer head 102 comprising temperature sensor module 130 can beused to measure and record the temperature during the measurement. Insome embodiments, the temperature sensor element can measure thetemperature of the sample in response to infrared radiation emitted fromthe sample, and transmit the temperature measurement to a processor.Accurate and/or precise temperature measurement can be used tostandardize or modify the spectrum produced. For example, differentspectra of a given sample can be measured based on the temperature atwhich the spectrum was taken. In some embodiments, a spectrum can bestored with metadata relating to the temperature at which the spectrumwas measure. In many embodiments, the temperature sensor module 130comprises a temperature sensor window 132. The temperature sensor windowcan seal the sensor module. The temperature sensor window 132 can bemade of material that is substantially non-transmissive to visible lightand transmits light in the infrared spectrum. In some embodiments thetemperature sensor window 132 comprises germanium, for example. In someembodiments, the temperature sensor window is about 0.2, 0.3, 0.4, 0.5,0.6, 0.7, 0.8, 0.9 or 1.0 mm thick.

The temperature sensor can comprise a field of view (herein after “FoV”)limiter. In many embodiments, the temperature sensor has a field of vieworiented to overlap with a field of view of the detector and a field ofview of an illuminator. For example, the field of view can be limited byan aperture formed in a material supporting the window 132 oftemperature sensor module and the dimensions of the temperature sensor134. In some embodiments, the temperature sensor module has a limitedfield of view and comprises a heat conductive metal cage disposed on aflex printed circuit board (PCB) 136. The PCB 136 can be mounted on astiffener 138 in order to inhibit movement relative to the other moduleson the sensor head. In some embodiments, the flexible circuit board isbacked by stiffener 138 comprising a metal. The temperature sensor 134can be a remote temperature sensor. In some embodiments, the temperaturesensor can give a temperature that is accurate to within about 5, 4, 3,2, 1, 0.7, 0.4, 0.3, 0.2 or 0.1 degree Celsius of the ambienttemperature of the sample. In some embodiments, the temperature sensormeasures the ambient temperature with precision to 3, 2, 1, 0.5, or 0.1degree Celsius.

In many embodiments, the spectrometer head comprises illumination module140. The illumination module can illuminate a sample with light. In someembodiments, the illumination module comprises an illumination window142. The illumination window can seal the illumination module. Theillumination window can be substantially transmissive to the lightproduced in the illumination module. For example, the illuminationwindow can comprise glass. The illumination module can comprise a lightsource 148. In some embodiments, the light source can comprise one ormore light emitting diodes (LED). In some embodiments, the light sourcecomprises a blue LED. In some embodiments, the light source comprises ared or green LED or an infrared LED.

The light source 148 can be mounted on a mounting fixture 150. In someembodiments, the mounting fixture comprises a ceramic package. Forexample, the light fixture can be a flip-chip LED die mounted on aceramic package. The mounting fixture 150 can be attached to a flexibleprinted circuit board (PCB) 152 which can optionally be mounted on astiffener 154 to reduce movement of the illumination module. The flexPCB of the illumination module and the PCT of temperature sensor modulesmay comprise different portions of the same flex PCB, which may alsocomprise portions of spectrometer PCB.

The wavelength of the light produced by the light source 148 can beshifted by a plate 146. Plate 146 can be a wavelength shifting plate. Insome embodiments, plate 146 comprises phosphor embedded in glass.Alternatively or in combination, plate 146 can comprise a nano-crystal,a quantum dot, or combinations thereof. The plate can absorb light fromthe light source and release light having a frequency lower than thefrequency of the absorbed light. In some embodiments, a light sourceproduces visible light, and plate 146 absorbs the light and emits nearinfrared light. In some embodiments, the light source is in closeproximity to or directly touches the plate 146. In some embodiments, thelight source and associated packaging is separated from the plate by agap to limit heat transfer. For example the gap between the light sourceand the plate can be at least 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8,0.9, 1.0, 1.5, 2.0, 2.5, 3.0, 3.5, 4.0, 5.0, 6.0, 7.0, 8.0, 9.0, or 10.0mm. In many alternative embodiments, the light source packaging touchesthe plate 146 in order to conduct heat from the plate such that thelight source packaging comprises a heat sink.

The illumination module can further comprise a light concentrator suchas a parabolic concentrator 144 or a condenser lens in order toconcentrate the light. In some embodiments, the parabolic concentrator144 is a reflector. In some embodiments, the parabolic concentrator 144comprises stainless steel. In some embodiments, the parabolicconcentrator 144 comprises gold-plated stainless steel. In someembodiments, the concentrator can concentrate light to a cone. Forexample, the light can be concentrated to a cone with a field of view ofabout 30-45, 25-50, or 20-55 degrees.

In some embodiments, the illumination module is configured to transmitlight and the spectrometer module is configured to receive light alongoptical paths extending substantially perpendicular to an entrance faceof the spectrometer head. In some embodiments, the modules can beconfigured to such that light can be transmitted from one module to anobject (such as a sample 108) and reflected or scattered to anothermodule which receives the light.

In some embodiments, the optical axes of the illumination module and thespectrometer module are configured to be non-parallel such that theoptical axis representing the spectrometer module is at an offset angleto the optical axis of the illumination module. This non-parallelconfiguration can be provided in one or more of many ways. For example,one or more components can be supported on a common support and offsetin relation to an optic such as a lens in order to orient one or moreoptical axes toward each other. Alternatively or in combination, amodule can be angularly inclined with respect to another module. In someembodiments, the optical axis of each module is aligned at an offsetangle of greater than 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18, 20,25, 30, 35, 40, 45, or 50 degrees. In some embodiments, the illuminationmodule and the spectrometer module are configured to be aligned at anoffset angle of less than 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 12, 14, 16, 18,20, 25, 30, 35, 40, 45, or 50 degrees. In some embodiments, theillumination module and the spectrometer module are configured to bealigned at an offset angle between than 1-10, 11-20, 21-30, 31-40 or41-50 degrees. In some embodiments, the offset angle of the modules isset firmly and is not adjustable. In some embodiments, the offset angleof the modules is adjustable. In some embodiments, the offset angle ofthe modules is automatically selected based on the distance of thespectrometer head from the sample. In some embodiments, two modules haveparallel optical axes. In some embodiments, two or more modules haveoffset optical axes. In some embodiments, the modules can have opticalaxes offset such that they converge on a sample. The modules can haveoptical axes offset such that they converge at a set distance. Forexample, the modules can have optical axes offset such that theyconverge at a distance of about 10, 20, 30, 40, 50, 60, 70, 80, 90, 100,150, 200, 250, 300, 350, 400, or 500 mm away.

FIG. 5 shows a schematic drawing of cross-section B of the spectrometerhead of FIGS. 3 and 4, in accordance with embodiments. In manyembodiments, the spectrometer head 102 comprises spectrometer module160. The spectrometer module can be sealed by a spectrometer window 162.In some embodiments, the spectrometer window 162 is selectivelytransmissive to light with respect to the wavelength in order to analyzethe spectral sample. For example, spectrometer window 162 can be anIR-pass filter. In some embodiments, the window 162 can be glass. Thespectrometer module can comprise one or more diffusers. For example, thespectrometer module can comprise a first diffuser 164 disposed below thespectrometer window 162. The first diffuser 164 can distribute theincoming light. For example, the first diffuser can be a cosinediffuser. Optionally, the spectrometer module comprises a light filter188. Light filter 188 can be a thick IR-pass filter. For example, filter188 can absorb light below a threshold wavelength. In some embodiments,filter 188 absorbs light with a wavelength below about 1000, 950, 900,850, 800, 750, 700, 650, or 600 nm. In some embodiments, thespectrometer module comprises a second diffuser 166. The second diffusercan generate lambertian light distribution at the input of the filtermatrix 170. The filter assembly can be sealed by a glass plate 168.Alternatively or in combination, the filter assembly can be furthersupported a filter frame 182, which can attach the filter assembly tothe spectrometer housing 180. The spectrometer housing 180 can hold thespectrometer window 162 in place and further provide mechanicalstability to the module.

The first filter and the second filter can be arranged in one or more ofmany ways to provide a substantially uniform light distribution to thefilters. The substantially uniform light distribution can be uniformwith respect to an average energy to within about 25%, for example towithin about 10%, for example. In many embodiments the first diffuserdistributes the incident light energy spatially on the second diffuserwith a substantially uniform energy distribution profile. In someembodiments, the first diffuser makes the light substantially homogenouswith respect to angular distribution. The second diffuser furtherdiffuses the light energy of the substantially uniform energydistribution profile to a substantially uniform angular distributionprofile, such that the light transmitted to each filter can besubstantially homogenous both with respect to the spatial distributionprofile and the angular distribution profile of the light energyincident on each filter. For example, the angular distribution profileof light energy onto each filter can be uniform to within about +/−25%,for example substantially uniform to within about +/−10%.

In many embodiments, the spectrometer module comprises a filter matrix170. The filter matrix can comprise one or more filters. In manyembodiments, the filter matrix comprises a plurality of filters. Forexample, the filter matrix can comprise filters arranged in a square,rectangle, circle, oval, or disordered arrangement of filters. Thefilter array can comprise at least 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11,12, 13, 14, 15, 16, 17, 18, 19, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65,70, 75, 80, 85, 90, 95, 100, 200 or more filters. In some embodiments,the filter matrix comprises between 1 and 36 inclusive filters arrangedin a square or rectangular arrangement selected from the groupconsisting of 1×1, 1×2, 2×2, 3×1, 2×3, 3×3, 4×1, 4×2, 4×3, 4×4, 5×1,5×2, 5×3, 5×4, 5×5, 6×1, 6×2, 6×3, 6×4, 6×5 or 6×6. In some embodiments,the filter array comprises between about 10 and about 100 filters. Insome embodiments, the filter array comprises between about 10 and about30 filters. In some embodiments, the filter array comprises 4 rowsfilters wherein each row comprises 3 filters.

In some embodiments, each filter of the filter matrix 170 is configuredto transmit a range of wavelengths distributed about a centralwavelength. The range of wavelengths can be defined as a full width halfmaximum (hereinafter “FWHM”) of the distribution of transmittedwavelengths for a light beam transmitted substantially normal to thesurface of the filter as will be understood by a person of ordinaryskill in the art. A wavelength range can be defined by a centralwavelength and by a spectral width. The central wavelength can be themean wavelength of light transmitted through the filter, and the bandspectral width of a filter can be the difference between the maximum andthe minimum wavelength of light transmitted through the filter. Forexample, a filter can have a central wavelength of 300 nm and awavelength range of 20 nm which would transmit light having a wavelengthfrom 290 to 310 nm, and the filter would substantially not transmitlight below 290 nm or above 310 nm. In some embodiments, each filter ofthe plurality of filters is configured to transmit a range ofwavelengths different from other filters of the plurality. In someembodiments, the range of wavelengths overlaps with ranges of said otherfilters of the plurality and wherein said each filter comprises acentral wavelength different from said other filters of the plurality.In some embodiments, the spectral width of each filter is less than 200,190, 180, 170, 160, 150, 140, 130, 120, 110, 100, 90, 80, 70, 60, 50,40, 30, 20, 18, 16, 14, 12, 10, 8, 6, 4, 3, 2, or 1 nm. In someembodiments, the spectral width of each filter is at least 1, 2, 4, 6,8, 10, 12, 14, 16, 18, 20, 30, 40, 50, 60, 70, 80, 90, or 100 nm. Insome embodiments, the spectral width of each filter is between about 1to about 60 nm, about 2 to about 50 nm, from about 4 to about 40 nm, orfrom about 8 to about 30 nm. In some embodiments, the centralwavelengths of each filter at least 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11,12, 14, 16, 18, 20, 25, 30, 35, 40, 50, 60, 70, 80, 90, 100, or 200 nmfrom the central wavelength of each other filter.

In many embodiments, the filter array comprises a substrate having athickness and a first side and a second side, the first side orientedtoward the diffuser, the second side oriented toward the lens array. Insome embodiments, each filter of the filter array comprises a substratehaving a thickness and a first side and a second side, the first sideoriented toward the diffuser, the second side oriented toward the lensarray. The filter array can comprise one or more coatings on the firstside, on the second side, or a combination thereof. Each filter of thefilter array can comprise one or more coatings on the first side, on thesecond side, or a combination thereof. In some embodiments, each filterof the filter array comprises one or more coatings on the second side,oriented toward the lens array. In some embodiments, each filter of thefilter array comprises one or more coatings on the second side, orientedtoward the lens array and on the first side, oriented toward thediffuser. The one or more coatings on the second side can be an opticalfilter. For example, the one or more coatings can permit a wavelengthrange to selectively pass through the filter. Alternatively or incombination, the one or more coatings can be used to inhibit cross-talkamong lenses of the array. In some embodiments, the plurality ofcoatings on the second side comprises a plurality of interferencefilters, said each of the plurality of interference filters on thesecond side configured to transmit a central wavelength of light to onelens of the plurality of lenses. In some embodiments, the filter arraycomprises one or more coatings on the first side of the filter array.The one or more coatings on the first side of the array can comprise acoating to balance mechanical stress. In some embodiments, the one ormore coatings on the first side of the filter array comprises an opticalfilter. For example, the optical filter on the first side of the filterarray can comprise an IR pass filter to selectively pass infrared light.In many embodiments, the first side does not comprise a bandpassinterference filter coating. In some embodiments, the first does notcomprise a coating.

In many embodiments, the array of filters comprises a plurality ofbandpass interference filters on the second side of the array. Theplacement of the fine frequency resolving filters on the second sideoriented toward the lens array and apertures can inhibit cross-talkamong the filters and related noise among the filters. In manyembodiments, the array of filters comprises a plurality of bandpassinterference filters on the second side of the array, and does notcomprise a bandpass interference filter on the first side of the array.

In many embodiments, each filter defines an optical channel of thespectrometer. The optical channel can extend from the filer through anaperture and a lens of the array to a region of the sensor array. Theplurality of parallel optical channels can provide increased resolutionwith decreased optical path length.

The spectrometer module can comprise an aperture array 172. The aperturearray can prevent cross talk between the filters. The aperture arraycomprises a plurality of apertures formed in a non-opticallytransmissive material. In some embodiments, the plurality of aperturesis dimensioned to define a clear lens aperture of each lens of thearray, wherein the clear lens aperture of each lens is limited to onefilter of the array. In some embodiments, the clear lens aperture ofeach lens is limited to one filter of the array.

In many embodiments the spectrometer module comprises a lens array 174.The lens array can comprise a plurality of lenses. The number of lensescan be determined such that each filter of the filter array correspondsto a lens of the lens array. Alternatively or in combination, the numberof lenses can be determined such that each channel through the supportarray corresponds to a lens of the lens array. Alternatively or incombination, the number of lenses can be selected such that each regionof the plurality of regions of the image sensor corresponds to anoptical channel and corresponding lens of the lens array and filter ofthe filter array.

In many embodiments, each lens of the lens array comprises one or moreaspheric surfaces, such that each lens of the lens array comprises anaspherical lens. In many embodiments, each lens of the lens arraycomprises two aspheric surfaces. Alternatively or in combination, one ormore individual lens of the lens array can have two curved opticalsurfaces wherein both optical surfaces are substantially convex.Alternatively or in combination, the lenses of the lens array maycomprise one or more diffractive optical surfaces.

In many embodiments, the spectrometer module comprises a support array176. The support array 176 comprises a plurality of channels 177 definedwith a plurality of support structures 179 such as interconnectingannuli. The plurality of channels 177 may define optical channels of thespectrometer. The support structures 179 can comprises stiffness to addrigidity to the support array 176. The support array may comprise astopper to limit movement and fix the position the lens array inrelation to the sensor array. The support array 176 can be configured tosupport the lens array 174 and fix the distance from the lens array tothe sensor array in order to fix the distance between the lens array andthe sensor array at the focal length of the lenses of the lens array. Inmany embodiments, the lenses of the array comprise substantially thesame focal length such that the lens array and the sensor array arearranged in a substantially parallel configuration.

The support array 176 can extend between the lens array 174 and thestopper mounting 178. The support array 176 can serve one or morepurposes, such as 1) providing the correct separation distance betweeneach lens of lens array 170 and each region of the plurality of regionsof the image sensor 190, and/or 2) preventing stray light from enteringor exiting each channel, for example. In some embodiments, the height ofeach support in support array 176 is calibrated to the focal length ofthe lens within lens array 174 that it supports. In some embodiments,the support array 176 is constructed from a material that does notpermit light to pass such as substantially opaque plastic. In someembodiments, support array 176 is black, or comprises a black coating tofurther reduce cross talk between channels. The spectrometer module canfurther comprise a stopper mounting 178 to support the support array. Inmany embodiments, the support array comprises an absorbing and/ordiffusive material to reduce stray light, for example.

In many embodiments, the support array 176 comprises a plurality ofchannels having the optical channels of the filters and lenses extendingtherethrough. In some embodiments, the support array comprise a singlepiece of material extending from the lens array to the detector (i.e.CCD or CMOS array).

The lens array can be directly attached to the aperture array 172, orcan be separated by an air gap of at least 1, 2, 3, 4, 5, 6, 7, 8, 9,10, 12, 14, 16, 18, 20, 30, 40, or 50 micrometers. The lens array can bedirectly on top of the support array 178. Alternatively or incombination, the lens array can be positioned such that each lens issubstantially aligned with a single support stopper or a single opticalisolator in order to isolate the optical channels and inhibitcross-talk. In some embodiments, the lens array is positioned to be at adistance approximately equal to the focal length of the lens away fromthe image sensor, such that light coming from each lens is substantiallyfocused on the image sensor.

In some embodiments, the spectrometer module comprises an image sensor190. The image sensor can be a light detector. For example, the imagesensor can be a CCD or 2D CMOS or other sensor, for example. Thedetector can comprise a plurality of regions, each region of saidplurality of regions comprising multiple sensors. For example, adetector can be made up of multiple regions, wherein each region is aset of pixels of a 2D CMOS. The detector, or image sensor 190, can bepositioned such that each region of the plurality of regions is directlybeneath a different channel of support array 176. In many embodiments,an isolated light path is established from a single of filter of filterarray 170 to a single aperture of aperture array 172 to a single lens oflens array 174 to a single stopper channel of support array 176 to asingle region of the plurality of regions of image sensor 190.Similarly, a parallel light path can be established for each filter ofthe filter array 170, such that there are an equal number of parallel(non-intersecting) light paths as there are filters in filter array 170.

The image sensor 190 can be mounted on a flexible printed circuit board(PCB) 184. The PCB 184 can be attached to a stiffener 186. In someembodiments, the stiffener comprises a metal stiffener to prevent motionof the spectrometer module relative to the spectrometer head 120.

FIG. 6 shows an isometric view of a spectrometer module 160 inaccordance with embodiments. The spectrometer module 160 comprises manycomponents as described herein. In many embodiments, the support array176 can be positioned on a package on top of the sensor. In manyembodiments, the support array can be positioned over the top of thebare die of the sensor array such that an air gap is present. The airgap can be less than 10, 9, 8, 7, 6, 5, 4, 3, 2 or 1 micrometer(s).

FIG. 7 shows the lens array 174 within the spectrometer module 160, inaccordance with embodiments. This isometric view shows the apertures 194formed in a non-transmissive material of the aperture array 172 inaccordance with embodiments. In many embodiments, each channel of thesupport array 176 is aligned with a filter of the filter array 170, alens of the lens array 174, and an aperture 194 of the aperture array inorder to form a plurality of light paths with inhibited cross talk.

FIG. 8 shows a spectrometer 102 in accordance with embodiments. Thespectrometer can comprise an optical head which can comprise aspectrometer module 160. The spectrometer can further comprise atemperature sensor module. In many embodiments, the spectrometercomprises an illumination module. In many embodiments, the spectrometercomprises light emitting diodes 196 distinct from an illuminationmodule. The spectrometer can also comprise further components such as aBluetooth™ module to communicate data to another device, a spectrometerprocessor 106, a power supply, or combinations thereof.

Although the detailed description contains many specifics, these shouldnot be construed as limiting the scope of the disclosure but merely asillustrating different examples and aspects of the present disclosure.It should be appreciated that the scope of the disclosure includes otherembodiments not discussed in detail above. Various other modifications,changes and variations which will be apparent to those skilled in theart may be made in the arrangement, operation and details of the methodand apparatus of the present disclosure provided herein withoutdeparting from the spirit and scope of the invention as describedherein.

As used herein like characters identify like elements.

While preferred embodiments of the present disclosure have been shownand described herein, it will be obvious to those skilled in the artthat such embodiments are provided by way of example only. Numerousvariations, changes, and substitutions will be apparent to those skilledin the art without departing from the scope of the present disclosure.It should be understood that various alternatives to the embodiments ofthe present disclosure described herein may be employed withoutdeparting from the scope of the present invention. Therefore, the scopeof the present invention shall be defined solely by the scope of theappended claims and the equivalents thereof.

What is claimed is:
 1. A spectrometer configured to measure a spectrumof a sample comprising: an illuminator comprising: a primary radiationemitter to emit primary radiation within a first wavelength range; asecondary radiation emitter configured to absorb the primary radiationand to emit secondary radiation within a second wavelength rangedifferent from the first wavelength range; a spectral detector; and oneor more filters between the sample and the spectral detector, whereinthe one or more filters comprise one or more coatings and are configuredto transmit the secondary radiation to the spectral detector, andwherein the spectral detector is configured to resolve wavelengths ofthe secondary radiation for measuring the spectrum of the sample.
 2. Thespectrometer of claim 1, wherein the first wavelength range is within avisible range and the second wavelength range is within an infraredrange.
 3. The spectrometer of claim 2, wherein the secondary radiationemitter comprises near infra-red phosphor.
 4. The spectrometer of claim1, further comprising an additional filter configured to block radiationin the first wavelength range.
 5. The spectrometer of claim 1, whereineach of the plurality of filters of the filter array is configured totransmit a range of wavelengths different from other filters of theplurality of filters.
 6. The spectrometer of claim 5, wherein the rangeof wavelengths of the plurality of filters is included in the secondwavelength range of the secondary radiation emitter.
 7. The spectrometerof claim 5, wherein the plurality of filters comprises a plurality ofinterference filters, the plurality of interference filters are arrangedwith a plurality of lenses to determine spectra of each of a pluralityof regions of the spectral detector.
 8. The spectrometer of claim 5,wherein transmission spectra of the plurality of filters in the filterarray vary with angle of incidence.
 9. The spectrometer of claim 1,wherein the primary radiation emitter comprises one or more of a lightemitting diode or a laser diode and wherein the secondary radiationemitter comprises one or more of a phosphor plate and a phosphormaterial.
 10. The spectrometer of claim 1, further comprising a thermalsensor configured to measuring a temperature of the sample.
 11. Thespectrometer of claim 1, further comprising: a lens array comprising aplurality of lenses, each lens of the lens array corresponding to adifferent region of the spectral detector.
 12. The spectrometer of claim11, wherein the spectrometer comprises a handheld spectrometer andwherein the illuminator, the spectral detector and the filter array arearranged to be held with a hand of a user.
 13. The spectrometer of claim1, wherein the spectral detector comprises a plurality of pixels andwherein the portion of the secondary radiation received at differentpixels of the plurality of pixels corresponds to different wavelengthsof the secondary radiation.
 14. The spectrometer of claim 1, wherein theone or more filters are configured to transmit a portion of thesecondary radiation to the spectral detector, and wherein the spectraldetector is configured to resolve wavelengths of the portion of thesecondary radiation based on positions of incidence upon the spectraldetector of the portion of the secondary radiation.
 15. The spectrometerof claim 1, wherein the spectral detector is configured to resolvewavelengths of the secondary radiation based on positions of incidenceof the secondary radiation upon the spectral detector.